論文誌

[1] 畑 秀明, 水野 修, 菊野 亨, "開発履歴メトリクスを用いた細粒度な Fault-prone モジュール予測," 情報処理学会論文誌, volume 53, number 6, 1635–1643, 2012年6月.

国際会議

[1] Yoshiki Higo, Junnosuke Matsumoto, and Shinji Kusumoto, "Tree-Based Mining of Fine-Grained Code Changes to Detect Unknown Change Patterns," In the 28th Asia-Pacific Software Engineering Conference (APSEC 2021), pages 158-168, December 2021. [APSEC_2021_paper_30.pdf]

[2] Hiroaki Murakami, Keisuke Hotta, Yoshiki Higo, and Shinji Kusumoto, "Predicting Next Changes at the Fine-Grained Level," In Proceedings of the 21st Asia-Pacific Software Engineering Conference (APSEC2014), pages 126-133, December 2014. [apsec2014_h-murakm.pdf]

[3] Keisuke Hotta, Jiachen Yang, Yoshiki Higo, and Shinji Kusumoto, "How Accurate Is Coarse-Grained Clone Detection?: Comparison with Fine-Grained Detectors," In Proc. of the 8th International Workshop on Software Clones (IWSC 2014), pages 1-18, February 2014. [article.pdf]

[4] Hideaki Hata, Osamu Mizuno, and Tohru Kikuno, "Bug Prediction Based on Fine-Grained Module Histories," In Proc. of 34th International Conference on Software Engineering (ICSE2012), pages 200-210, June 2012. [© 2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. http://www.ieee.org/]