論文誌

[1] 柿元健, 門田暁人, 亀井靖高, まつ本真佑, 松本健一, 楠本真二, "Fault-proneモジュール判別におけるテスト工数割り当てとソフトウェア信頼性のモデル化," 情報処理学会論文誌, volume 50, number 7, pages 1716-1724, 2009年7月. [IPSJ-JNL5007002.pdf]

国際会議

[1] Hideaki Hata, Osamu Mizuno, and Tohru Kikuno, "Bug Prediction Based on Fine-Grained Module Histories," In Proc. of 34th International Conference on Software Engineering (ICSE2012), pages 200-210, June 2012. [© 2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. http://www.ieee.org/]