論文誌

[1] 畑 秀明, 水野 修, 菊野 亨, "開発履歴メトリクスを用いた細粒度な Fault-prone モジュール予測," 情報処理学会論文誌, volume 53, number 6, 1635–1643, 2012年6月.

国際会議

[1] Hideaki Hata, Osamu Mizuno, and Tohru Kikuno, "Bug Prediction Based on Fine-Grained Module Histories," In Proc. of 34th International Conference on Software Engineering (ICSE2012), pages 200-210, June 2012. [© 2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. http://www.ieee.org/]