論文誌

[1] 畑 秀明, 水野 修, 菊野 亨, "開発履歴メトリクスを用いた細粒度な Fault-prone モジュール予測," 情報処理学会論文誌, volume 53, number 6, 1635–1643, 2012年6月.

国際会議

[1] Hideaki Hata, Osamu Mizuno, and Tohru Kikuno, "Bug Prediction Based on Fine-Grained Module Histories," In Proc. of 34th International Conference on Software Engineering (ICSE2012), pages 200-210, June 2012.